Optical Design and Thin Film Coating Facility
Optical Design and Thin Film Coating Facility
Our facility is capable of optical design, optical manufacturing, infrared thin film coating, diamond like carbon (DLC) coating and metrology.

In addition to R&D activities and consultancy needed by the optics industry, mass production is carried out with our industry standard infrastructure.

Our capabilities are as follows.

ISO 7 Clean Room System
ISO 7 Clean Room System
• 120 m2 class 10000 cleanroom
• 200 m2 machine room
• Compressed air, nitrogen generator, sandblaster, chiller, ultra pure water systems and wet & flow benches
Optical Design
Optical Design
Design of Optical Systems and Components
• Zemax OpticStudio design software
• Lenses, mirrors, prisms and freeform surfaces
• Zoom lens, objectives and complex systems
• Opto-mechanic design

Optical Thin Film Design
• Optilayer Thin Film Design Software
• Anti-reflective coatings
• Mirror surfaces
• All kinds of filter coatings
• Beamsplitter surfaces
• Polarizers and color coatings
Optical Manufacturing
Optical Manufacturing
Single Point Diamond Turning
• Precitech Nanoform X SPDT Lathe
• Upto 440mm dimamter machining
• Spherical, aspherical, diffractive, conical, fresnel, prism and free-form optical surfaces
• Virtual/augmented reality, LIDAR/remote sensing
• Spectrograph/hyperspectral imaging, Medical imaging
• Portable consumer optoelectronic devices
• Optical components including the optics of cameras, x-ray, lasers, solar cells and mobile phones
• Injection molding, replication and electroforming
• Processing plastics, glass and crystals, metals, alloys and metal coatings
Optical Thin Film Coating
Optical Thin Film Coating
• Thin film coating and product development in regions (VIS, NIR, SWIR, MWIR, LWIR)
• Hanil Vacuum 900DA PVD system
• 900 mm chamber size
• 10-7 Torr High Vacuum Pumping
• Chamber temperature up to 300 degrees
• Dome type rotation system for substartes
• Electron Beam, Ion Beam and Resistance heat sources
• Tavg > 98% - Ravg < 0.4% @ 3.6–4.9μm
on Ge, Si,&-CaF2 substrates

In the defense industry
• Forward Looking Infrared (FLIR) used in military vehicles (fighter jets, drones, etc.) and equipment
• Thermal scanner warhead (heat-seeking) system
• Night and thermal vision camera applications

Other industrial applications
• Safety technology; filters for gas analysis, mining, alcohol measurement, building technology
• Environmental technology; biogas analysis, greenhouse gas analysis, emission monitoring
• Medical technology; patient and anesthesia monitoring
• Agriculture; biogas plants, quality control
• Flame detection; pyroelectric detectors
• Infrared spectroscopy; chemical analysis, e.g. alcohol, sugar and water content

Hard Carbon DLC Coating
Hard Carbon DLC Coating
• Functional coatings DLC (diaomond like carbon) compatible with military standards
• DLC integrated Multilayer Coating
• Uniformity < +/- 2.5%
• Raverage < 4% @ 3.4 – 4.6um, DLC Si
• Raverage < 4% @8 – 12um, DLC Ge
• RF Plasma with Auto Matching
• Substrate holder up to 585mm in diameter
• High resistivity multispectral optical coatings
• Durable and stable operation of optics
• Other areas of use: Engine parts and injectors, Aviation fasteners and components, Industrial machine components, Aluminum and non-ferrous metal forming, Plastic injection molding tools, Medical instruments, Cutting tools, Hard chrome replacement, Semiconductor technology, Watches and jewelry
Non-Contact 3D Optical Profilometer
Non-Contact 3D Optical Profilometer
• Step height measurement
• Surface topography
• Measurement of surface roughness parameters
• Imaging of nano and micro structures
Contact Stylus Profilometer
Contact Stylus Profilometer
• Measurement of surface quality and shape
• Surface finish and form measurement
• Spherical/Aspherical and freeform surface analysis
• 300 mm single track measurement
FTIR Spectroscopy
FTIR Spectroscopy
• Analysis of thin films and coatings
• 2 - 25 micrometer bandwidth optical reflectance and transmittance measurements
Laser Interferometer
Laser Interferometer
• Surface shape error
• Transmitted wavefront measurement
 

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